3 patents
Utility
Methods for the Comprehensive Identification of Antimicrobial Resistance Markers by Sequencing
3 Nov 22
The present invention relates to the systematic identification of antimicrobial resistance markers (biomarkers) in a microorganism for a particular compound and the use of such identified markers for the screening of microorganisms for antimicrobial resistance, as well as for screening/predicting antimicrobial compounds that can overcome the resistance provided by one or more of the antimicrobial resistance marker(s).
Andreas Posch, Jonas Ramoni, Stephan Beisken, Achim Plum
Filed: 20 Jul 22
Utility
Methods for the Comprehensive Identification of Antimicrobial Resistance Markers by Sequencing
26 Aug 21
The present invention relates to the systematic identification of antimicrobial resistance markers (biomarkers) in a microorganism for a particular compound and the use of such identified markers for the screening of microorganisms for antimicrobial resistance, as well as for screening/predicting antimicrobial compounds that can overcome the resistance provided by one or more of the antimicrobial resistance marker(s).
Andreas Posch, Jonas Ramoni, Stephan Beisken, Achim Plum
Filed: 7 Nov 18
Utility
Systems, Apparatus, and Methods for Generating and Analyzing Resistome Profiles
9 Sep 20
Systems, apparatus, and methods are disclosed for generating a resistome profile for a subject, monitoring an infection state of one or more subjects, and/or identifying a potential infection outbreak at a facility, for example, by obtaining first data representative of at least one measure of antibiotic resistance of an organism from a first sample, identifying the organism, determining at least one of an antibiotic susceptibility phenotype, an identity of an antibiotic resistance gene, and an antibiotic to which the organism is non-susceptible, generating and comparing a first pattern to at least one known pattern to determine and generate a profile uniqueness identifier indicating a degree of similarity above a threshold between the first pattern and the at least one known pattern.
Evan Jones, Vadim Sapiro, George Terrance Walker, Alex Saeed
Filed: 10 Nov 19
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